http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113131909-A

Outgoing Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2621
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filingDate 2020-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f092c66354efb7e295cb8674e8b6eda1
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publicationDate 2021-07-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-113131909-A
titleOfInvention Method and apparatus for transistor health monitoring
abstract Embodiments of the present application relate to methods and apparatus for transistor health monitoring. Example gate drivers (504) include: request receiver pins (503), measurement transmitter pins (505), and driver control logic pins (507), the request receiver pins, the measurement transmitter pins and the driver control logic pins are configured to couple to a controller (502); a sense pin (544), which will be coupled to a sense circuit (510); a control logic circuit (506), It has an input coupled to the request receiver pin; a transistor (512) coupled to the control logic circuit and the sense pin; a multiplexer (514) coupled to the control logic and the sense pins; analog-to-digital converter ADC (516) coupled to the multiplexer and measurement transmitter pins; and driver control logic (518) coupled to to the driver control logic pins.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115754656-A
priorityDate 2019-12-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 23.