http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112903393-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N3-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N3-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N3-08 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-34 |
| filingDate | 2021-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-112903393-B |
| titleOfInvention | Scanning electron microscope quasi-in-situ stretching based EBSD and DIC signal synchronous acquisition testing method |
| abstract | The invention discloses a testing method based on scanning electron microscope quasi-in-situ stretching EBSD and DIC signal synchronous acquisition, and relates to a testing method based on scanning electron microscope quasi-in-situ stretching. The invention aims to solve the problems that a single characterization means in the existing metal material deformation mechanism can not meet the analysis requirement, and the EBSD signal acquisition can not be realized because a sample table is still shielded after being inclined when a 70-degree sample frame for the existing EBSD test is used for testing the side section of a tensile sample. The method comprises the following steps: firstly, preprocessing; secondly, preparing mark points on the metal material to be detected; thirdly, performing quasi-in-situ stretching EBSD characterization; and fourthly, performing DIC characterization on the quasi-in-situ stretching. The method is suitable for testing based on scanning electron microscope quasi-in-situ stretching EBSD and DIC signal synchronous acquisition. |
| priorityDate | 2021-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.