http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112851351-B
Outgoing Links
Predicate | Object |
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classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B2235-38 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B35-622 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B35-547 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C04B35-547 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C04B35-622 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2020-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2021-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-112851351-B |
titleOfInvention | Method for directly synthesizing iron-doped zinc sulfide block through solid-phase reaction |
abstract | The invention discloses a method for directly synthesizing iron-doped zinc sulfide bulk materials by solid-phase reaction, which comprises the steps of weighing zinc sulfide and ferrous sulfide according to a doping proportion, grinding and uniformly mixing the zinc sulfide and the ferrous sulfide as initial raw materials; pressing the mixture powder into a cylinder, covering the end face with a sulfur powder wafer, filling the sulfur powder wafer into a platinum-graphite double-sample cavity, sealing the platinum-graphite double-sample cavity to prepare a sample, and placing the sample into an h-BN tube by taking the h-BN as a pressure transmission medium; carrying out high-temperature high-pressure reaction on a cubic apparatus press, taking out a reacted cylindrical sample, grinding and polishing, ultrasonically cleaning, air-drying, and then placing in an inert gas atmosphere for storage. The density of the obtained iron-doped zinc sulfide block is close to the theoretical density, the iron-doped zinc sulfide block is in a standard cylindrical shape, and can be directly used for testing the properties of semiconductors. |
priorityDate | 2020-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 40.