Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2029-7858 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y10-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0847 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66553 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0653 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-775 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42392 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-41791 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-785 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0673 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66439 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8234 |
filingDate |
2020-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c2f31c00a86e3079a0d8abdd9f15c8ad http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_57fe59b2c6975d00d18af7c95392fe82 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cacc99a5d8d2d7745270341c63e2226f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b791e32a59729c95a7d8fa13a513ce4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0a8be08ab0a80b392508cd32c2f8ae5b |
publicationDate |
2021-05-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CN-112750775-A |
titleOfInvention |
Method of forming semiconductor device |
abstract |
Here, a semiconductor device using a dielectric structure and a method for forming the semiconductor device will be described. The semiconductor device relates to a fully wound gate device, which is formed on a substrate and separated from each other by a dielectric structure. A dielectric structure is formed on the fin between the two fully wound gate devices, and the gate formed on the fin is cut into two separate gates. The two fully wound gate devices also have bottom spacers under the source/drain regions of the fully wound gate devices. Bottom spacers isolate the source/drain regions from the substrate. The dielectric structure has a shallow bottom that is higher than the bottom of the bottom spacer. |
priorityDate |
2019-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |