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filingDate 2020-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2021-05-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-112750775-A
titleOfInvention Method of forming semiconductor device
abstract Here, a semiconductor device using a dielectric structure and a method for forming the semiconductor device will be described. The semiconductor device relates to a fully wound gate device, which is formed on a substrate and separated from each other by a dielectric structure. A dielectric structure is formed on the fin between the two fully wound gate devices, and the gate formed on the fin is cut into two separate gates. The two fully wound gate devices also have bottom spacers under the source/drain regions of the fully wound gate devices. Bottom spacers isolate the source/drain regions from the substrate. The dielectric structure has a shallow bottom that is higher than the bottom of the bottom spacer.
priorityDate 2019-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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