| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f97a352c08e2dc3ac6c17be69636538c |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N20-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N5-01 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-24147
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-088
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-72
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F30-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-143
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V20-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-24323
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N20-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N20-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N20-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-04 |
| filingDate |
2020-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b0150611998bf0b9634b0a06b19106e6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a38368e9d44fed74a295a062822d4fd1 |
| publicationDate |
2021-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-112395936-A |
| titleOfInvention |
System and method for detecting defects in structures subjected to repetitive stress |
| abstract |
The present disclosure provides exemplary embodiments of systems and methods for detecting cracks and crack propagation in aircraft structures subjected to repetitive stress. A method for detecting the presence or expansion of defects in a structure includes monitoring the structure with an infrared sensor to provide thermal data of the structure within the infrared sensor's field of view. The thermal data in the memory is processed with a processor to extract features from the thermal data and utilize at least one machine learning model to detect the occurrence or expansion of defects in the structure. A system includes an infrared sensor having a field of view of the structure and a processor coupled to the infrared sensor and a memory containing instructions that cause the processor to process thermal data from the infrared sensor to extract the thermal data from the thermal data features, and utilizes at least one machine learning model to detect the presence or expansion of defects in the structure. |
| priorityDate |
2019-08-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |