http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112288680-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ade7c98fb2e25128b7be6502b20b48f4 |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10116 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20036 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0006 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 |
filingDate | 2019-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d54320f106e8c1f5f1206f51592ac1e3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e9a6cd8b71bd4e362ebded3d6f65e722 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5ae94e74daf2490fbff7c03415bfe907 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_08be8c84f9450862849c6e5f6048ba8d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2009ef88c8d7d35be919cc19dbdaf920 |
publicationDate | 2021-01-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-112288680-A |
titleOfInvention | Automatic defect area extraction method and system for automobile hub X-ray image |
abstract | The invention discloses a method and a system for automatically extracting a defect area of an automobile hub X-ray image. Firstly, obtaining an X-ray image of an automobile hub and constructing structural elements; then, carrying out top hat transformation and top hat reconstruction transformation on the X-ray image, and carrying out expansion reconstruction operation by taking a top hat reconstruction transformation result as a mark and a top hat transformation result as a template; carrying out binarization processing on the expansion reconstruction result to obtain a primary defect area of the hub; removing the characteristics of the primary defect area to obtain a real defect area of the hub; and obtaining the minimum circumscribed rectangle of the real defect area, namely the defect area of the hub X-ray image. The method provided by the invention is adopted to extract the defect area of the hub, an operator does not need to designate an area of interest in advance, but the defect area can be directly and automatically determined on the X-ray image of the detected hub, the method is not influenced by links such as wheel type identification and area tracking matching algorithm, and the extraction efficiency and accuracy of the defect area can be greatly improved. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114004837-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116205923-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114004837-B |
priorityDate | 2019-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419487869 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID119 |
Total number of triples: 26.