http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112083204-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1f0a4bec485e5c8317e194f193ebf0bb |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06705 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0425 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04 |
| filingDate | 2020-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f58b856630dd5fd80da46c3715dc0ebc |
| publicationDate | 2020-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-112083204-A |
| titleOfInvention | Semiconductor device and probe test method thereof |
| abstract | The invention discloses a semiconductor device, which comprises an upper shell and a lower shell, wherein connecting pipes are arranged on opposite surfaces of the upper shell and the lower shell, a thread groove is formed in the inner wall of the upper shell, a length adjusting pipe is in threaded connection with the inner wall of the thread groove, and an outer thread groove is formed in the outer surface of the length adjusting pipe; the invention also provides a probe test method of the semiconductor device, which comprises the following steps: s1, rotating the lower shell, taking the lower shell off the connecting pipe, and mounting the connecting column at the bottom end of the transmission pressure lever in a threaded manner. This semiconductor test probe through setting up left pincers body, right pincers body and reset spring, presses the transmission depression bar, and left pincers body and right pincers body are the state of opening under the reset spring effect, with left pincers body and right pincers body joint in semiconductor pin both sides, unclamp the transmission depression bar and make it press from both sides the pin tightly, fixed, need not press with the hand for a long time, conveniently test the semiconductor to realize firm in connection's effect. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113009196-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113009196-A |
| priorityDate | 2020-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341 |
Total number of triples: 19.