http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111999254-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b4711b7defc1422cdb7f86d2c95657bf |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30164 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10048 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10036 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8887 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3563 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-003 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-007 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3563 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 |
| filingDate | 2020-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e123de4a342a793eb948e197ff12380e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d8403119cee41a6422e280da016fc24f |
| publicationDate | 2020-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-111999254-A |
| titleOfInvention | Additive Manufacturing Defect Detection System Based on Dual Channel |
| abstract | The invention belongs to the technical field of additive manufacturing, in particular to a dual-channel based additive manufacturing defect detection system. The system of the invention includes a multi-spectral light source module, a light source control module, an image acquisition module and an image processing module; the light source control module is connected with the multi-spectral light source module, and is used for controlling the emission of the multi-spectral light source to the additive product during the defect detection of additive manufacturing. and receive the multi-spectral light signal reflected by the additive part through the image acquisition module; the image analysis and processing module performs image processing and analysis on the visible light and infrared imaging information of the additive part collected by the image acquisition module, quickly Identify and evaluate defect categories for additive parts. The invention can realize the multi-channel defect detection of the additive product, the structure is simple and easy to realize, the detection real-time performance is good, the precision is high, and the problem of the detail loss of the additive product under the single-channel image detection can be avoided. Helps improve the final quality of additive parts. |
| priorityDate | 2020-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 |
Total number of triples: 29.