http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111596195-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1b9b176e64c56a5d53a2963d7cec99dc |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2843 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2632 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2020-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3e931f3024b7862eeddb635e6645ea95 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ec8570e22ed9e5d7b9cbd10ffdf69f0c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f18151a1b93cad222e74fe6cdf540ccd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7582f79c3c2888eef6c62a419cb3fa98 |
| publicationDate | 2020-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-111596195-A |
| titleOfInvention | A method and apparatus for detecting a diode circuit |
| abstract | The present application discloses a method and device for detecting a diode circuit. The diode circuit is one of a series diode circuit and a parallel diode circuit. The method includes: using a test drive source to pair a voltage value and a current value applied to the diode circuit under test. At least one of the steps is incrementally increased in sequence; and the actual output voltage value and output current value after the increment is applied by the diode circuit under test is measured until the condition for ending the increment is reached. The purpose of this application is at least to be able to quickly and accurately test series-parallel diode circuits with large voltage and wide current, and to effectively prevent the diode circuit under test from being applied too much when there are major defects such as short circuit, continuous welding, open circuit, and virtual welding of individual components. Damage caused by current and voltage to the diode circuit under test. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116299030-A |
| priorityDate | 2020-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 22.