http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111426928-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2637 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-02 |
| filingDate | 2018-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2021-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-111426928-B |
| titleOfInvention | Dynamic resistance test circuit for gallium nitride device |
| abstract | A dynamic resistance test circuit of a gallium nitride device comprises a gate driving module, a clamping circuit and a load module, wherein the gate driving module is used for driving the device to be tested, the other end of the load module is connected with a power supply DC, the clamping circuit comprises a voltage stabilizing module and a high-voltage diode D1, the anode of the high-voltage diode D1 is connected with one end of the voltage stabilizing module, the cathode of the high-voltage diode D1 is connected with one end of the load module and is used for being connected with the drain electrode of the gallium nitride device to be tested, the other end of the voltage stabilizing module is connected with a power ground and is used for being connected with the source electrode of the gallium nitride device to be tested, the clamping circuit further comprises a constant current module, and constant current output by the constant current module flows to the gallium nitride device to be tested through the high-voltage diode D1. The grid control signal of the device to be tested is provided by the driving module, the current flowing through the high-voltage diode when the device to be tested is conducted is provided by the constant current module, the voltage measured by the voltage detection point when the device to be tested is turned off is stabilized by the voltage stabilizing module, and the oscillation generated at the moment of switching of the switch of the device to be tested is suppressed by the filtering module. |
| priorityDate | 2018-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 18.