Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0217 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-324 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02337 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02211 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02343 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-6656 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-785 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0228 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76229 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7855 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-762 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8234 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 |
filingDate |
2019-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d3e89abcef0f81914af8a35c20080b96 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fa32f293c1722048618ae748be44aa2 |
publicationDate |
2020-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CN-111211089-A |
titleOfInvention |
Integrated circuit structure and method of making the same |
abstract |
The present disclosure relates to integrated circuit structures and methods of fabricating the same. An integrated circuit structure includes: a bulk semiconductor region; a first semiconductor strip above and connected to the bulk semiconductor region; and a dielectric layer including silicon oxide. Doping silicon oxide with carbon atoms. The dielectric layer includes a horizontal portion over and in contact with the top surface of the bulk semiconductor region, and a vertical portion connected to one end of the horizontal portion. The vertical portion is in contact with the sidewall of the lower portion of the first semiconductor strip. The tops of the first semiconductor strips protrude above the top surfaces of the vertical portions to form semiconductor fins. The horizontal and vertical sections have the same thickness. The gate stack extends over the sidewalls and top surface of the semiconductor fin. |
priorityDate |
2018-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |