http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111023983-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-45 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-45 |
| filingDate | 2019-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2020-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-111023983-B |
| titleOfInvention | Method for measuring thickness of luminescent layer and distance between luminescent molecule and electrode in solution based on electrochemiluminescence self-interference |
| abstract | The invention discloses a method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference, which comprises the following steps: (1) the electrolyte solution of the electrode system contains luminescent molecules or the surface of the working electrode is fixed with the luminescent molecules, the potential is applied to the electrode system, the luminescent molecules emit light to be used as a light source, and the working electrode generates interference light; (2) collecting interference light signals of the working electrode in a direction perpendicular to the working electrode by adopting a collimating mirror, an optical fiber and a slit in sequence, and recording the interference light signals by using an optical fiber spectrometer to obtain an electrochemiluminescence self-interference spectrum of the working electrode; (3) and analyzing and calculating the electrochemiluminescence self-interference spectrum by using a transmission matrix method and a two-beam interference method to obtain the thickness of the luminescent layer or the distance between the luminescent molecules and the electrode. The spatial resolution measured by the method reaches the nanometer level, and the method has important significance for researching the mechanism of electrochemical luminescence and improving the performance of the electrochemical luminescence. |
| priorityDate | 2019-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 46.