http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110907786-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-263 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2018-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-110907786-B |
| titleOfInvention | Method for measuring electrothermal coupling characteristic of thyristor device |
| abstract | The invention provides a method for measuring the electric-thermal coupling characteristic of a physically packaged thyristor device, which comprises the following steps: step 1, carrying out constant temperature treatment on a physically packaged thyristor device to reach a preset temperature; step 2, measuring one or more of the following parameters of the physically packaged thyristor by using a measurement loop: a gate cathode voltage, a gate cathode current, an anode current and a cathode and anode voltage; step 3, increasing the preset temperature by a certain temperature value, and returning to the step 2; and 4, fitting based on the obtained parameters to form a fitting curve. The measurement method provided by the invention realizes measurement of the electrothermal coupling characteristics of devices such as IGCT/ETO and the like. |
| priorityDate | 2018-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978 |
Total number of triples: 12.