http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110865292-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_389dd02530fff13ffedd9c6ece0083b6
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0408
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04
filingDate 2019-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3aba813c963f16eee028e8c53c6c2297
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dd4bc71f39d5e856a5072104a9028a86
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publicationDate 2020-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-110865292-A
titleOfInvention Burn-in board
abstract The invention discloses an aging test board, comprising: the upper surface of the base is provided with an accommodating groove; the test seats are arranged in the accommodating grooves and used for carrying out aging test on the piece to be tested; the conductive connecting piece is arranged in the accommodating groove and used for electrically connecting the test seats; the cover plate covers the upper surface of the base and is provided with through holes for the parts of the plurality of test seats to extend out; the base and the cover plate are made of high-temperature-resistant plastic materials, and the conductive connecting piece is made of a conductive metal strip. The invention can avoid using a PCB and a traditional soldering tin process, so that the aging test board can resist high temperature, and is safe and reliable.
priorityDate 2019-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 23.