http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110763685-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8893 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8887 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10004 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-04 |
| filingDate | 2019-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-12-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2020-12-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-110763685-B |
| titleOfInvention | Artificial intelligence detection method and device for surface defects of DFB semiconductor laser chips |
| abstract | The invention discloses an artificial intelligence detection method and a device for DFB semiconductor laser chip surface defects in the technical field of chip surface defect detection. The module is used to convert the image signal collected by the image acquisition module into a serial data signal; the DFB chip surface defect identification module is used to process the image serial data signal and extract the spectral characteristics of the image serial data signal; For the identification of surface defects, the present invention converts the collected image signals into serial data signals, uses a preset five-layer convolution layer and a maximum pooling layer to interleave the image serial data signals to process the image serial data signals, and extracts the image serial data signals. After the spectrum characteristics are obtained, the surface defects of the chip are identified according to the spectrum characteristics to detect the appearance of the DFB chip product, and the accuracy and efficiency of the appearance defect detection of the DFB chip product are improved. |
| priorityDate | 2019-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 28.