http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110687424-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2019-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2021-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-110687424-B |
| titleOfInvention | A low-temperature test system for high-frequency parameters of avalanche diodes |
| abstract | The invention discloses a low-temperature testing system for high-frequency parameters of avalanche diodes. The oscillator of the avalanche diode to be tested is provided with a circulator above the oscillator; the side walls of the test chamber are respectively provided with a first waveguide element, a second waveguide element, a first electrical connector and a second electrical connector; the test chamber Externally equipped with injection lock signal source, avalanche tube reverse bias power supply, power meter, high frequency test loop, harmonic mixing detection unit, temperature sensor power supply, vacuum pump, liquid nitrogen tank, program-controlled valve, flow meter, liquid nitrogen recovery device , a microcontroller and a display screen; the present invention can effectively suppress the existing technical defects of condensation and frost formation in the transmission circuit during the low temperature test of the avalanche diode, which leads to the increase of transmission loss and thus affects the reduction of the output efficiency of the millimeter-wave avalanche tube, and ensures the accuracy of the device test. . |
| priorityDate | 2019-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 13.