http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110579628-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q30-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q30-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-00 |
| filingDate | 2018-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-110579628-B |
| titleOfInvention | An in situ characterization device with extremely low thermal conductivity at the nanoscale |
| abstract | The present application discloses an in-situ characterization device with extremely low thermal conductivity on a nanometer scale, which is used to detect the micro-region thermal conductance of a sample of a thermoelectric material to be measured, including: an in-situ excitation module for nano-scale thermal signals for in-situ excitation One-fold and three-fold thermal signals related to the micro-area thermal conductance before and after contact with the tested material; a nano-scale thermal signal in-situ detection module for realizing the one-fold and three-fold thermal signals In-situ real-time detection and processing, and display the in-situ characterization results of the thermal conductivity of the micro-area; the heating frequency of the thermoelectric probe is in the range of 90Hz to 760Hz, ΔV 3ω and lnω have a linear relationship, and can be quantified according to the slope of the linear part The domain thermal conductance λ s is characterized. The present application combines the atomic force microscope nano-detection function, the Joule heating effect of the probe, the triple frequency excitation of thermal detection and the line heat source model, and establishes its in-situ characterization device based on the atomic force microscope with extremely low thermal conductivity at the nanoscale. |
| priorityDate | 2018-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.