| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a864329f69db5da3ce856121f76fe371 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30136 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-136
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-23213 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-136 |
| filingDate |
2019-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fc1c809b7e09149d71742df9303a4ba9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a5d56cb9b66625b61d6d243927f1319d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_767e02d80ffccfa11fee09f48b2f9f38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21732fb9c452955c5445fdc0cd2e4c5a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59f31243ba106e6c5532973adabadd0a |
| publicationDate |
2019-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-109615630-A |
| titleOfInvention |
Microstructure analysis method of semi-continuous casting Al-Si alloy based on image processing technology |
| abstract |
The invention discloses a method for analyzing the microstructure of a semi-continuously cast aluminum-silicon alloy based on an image processing technology. The defects are detected and removed; S3, the microstructure is segmented and analyzed based on K-means clustering and morphological methods. The experimental comparison results show that the method of segmenting and analyzing the metallographic structure based on K-means clustering and morphological methods can accurately segment most of the microstructures in the semi-continuously cast aluminum-silicon alloy images, and can accurately count the corrected iron. The microstructure in the phase image and the corrected silicon phase image, including the area information of the microstructure of small particles, and the area distribution interval of the statistical microstructure. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112907498-A |
| priorityDate |
2019-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |