Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76877 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76834 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76832 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02063 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-785 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76814 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76813 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76807 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768 |
filingDate |
2018-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2020-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2020-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CN-109427659-B |
titleOfInvention |
Semiconductor device and method of manufacture |
abstract |
An opening is formed in a dielectric material overlying a semiconductor substrate. The opening may include a via portion and a trench portion. During the manufacturing process, a treatment chemistry may be placed in contact with the exposed surface to release charge accumulated on the surface. By releasing the charge, the surface variation potential difference is reduced, helping to prevent galvanic corrosion during further manufacturing. Embodiments of the invention also relate to semiconductor devices and methods of manufacture. |
priorityDate |
2017-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |