http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108387562-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64 |
| filingDate | 2018-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2020-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-108387562-B |
| titleOfInvention | Method for adjusting axial position of pinhole in confocal microscope system |
| abstract | A method for adjusting the position of a pinhole in a confocal microscope system utilizes the nonlinear absorption effect of a phase-change material to judge the accurate focal position of the system by detecting an extreme point of a transmittance signal or a concave point of a reflectance signal, and then quickly and accurately determines the position of the pinhole in a reflected light detection module in the confocal microscope system according to the focal position. The invention realizes the rapid and accurate determination of the pinhole position in the confocal microscopic system, can achieve the nanometer-level precision, only needs one piece of coating material and has low cost. |
| priorityDate | 2018-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 13.