http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108362202-A

Outgoing Links

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filingDate 2018-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b262672c6dd7e07c6867670f2dea1e38
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publicationDate 2018-08-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-108362202-A
titleOfInvention Parameter Determination Method in Inclined Wavefront Interferometry Aspheric Surface
abstract The invention belongs to the field of optical precision testing, and in particular relates to a method for determining parameters in inclined wavefront interferometric measurement of aspheric surfaces. It includes the following steps: first, according to the given aspheric surface equation and caliber, divide the aspherical surface at equal intervals by angle; then set the center of the incident spherical wave, and use the formula to calculate the mirror point of the center of the spherical wave for each node; then use the mirror image The point emits light to the corresponding node coordinate position to form the reflected wave surface. According to the calculated distribution of the phase difference between the reflected wave surface and the reference spherical wave, the distribution range of the measurable interference fringes is judged, and the position of the center of the spherical wave is moved. Repeat the above Process, until the range of the entire aspheric surface can be measured, that is, the positions of all spherical wave sources are determined, and the design of the point source array is completed. The method has clear steps, accurate calculation and wide application range, and the computer program can be used to quickly complete the design, no approximate estimation is needed in the calculation process, and the calculation result is accurate.
priorityDate 2018-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 19.