http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108028757-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L2209-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L2209-26 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L9-0866 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09C1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L9-3278 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09C1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04L9-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04L9-08 |
| filingDate | 2016-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2021-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-108028757-B |
| titleOfInvention | Embedded test circuit for physical unclonable function |
| abstract | Silicon integrated circuits are disclosed that include a physically unclonable function and an in-line test circuit or embedded test circuit that includes one or more circuit portions that are physically adjacent to the PUF and that embody one or more tests that are performed to determine one or more quality properties of the PUF or otherwise characterize the PUF. Various tests are described with specific associated method steps. |
| priorityDate | 2015-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 |
Total number of triples: 18.