http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107925130-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0525 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-058 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-139 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-525 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3865 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-364 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-625 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-505 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-621 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-623 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M4-139 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-058 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M2-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M4-04 |
| filingDate | 2016-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2020-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-107925130-B |
| titleOfInvention | Method for measuring binder distribution in electrodes |
| abstract | A method of measuring the distribution of binder in an electrode is provided. The method includes: measuring the thickness of an electrode in which an active material layer including an active material, a conductive material and a binder is formed on the current collector (step 1); and fixing the active material layer of the electrode to Substrate to bring the active material layer into contact with the substrate (step 2); attach the removal tape to the current collector of the electrode, then measure the adhesive strength of the removal tape when the removal tape and current collector are removed, and measure the electrode after removal thickness (step 3); attach the removal tape to the active material layer from which the current collector was removed, then measure the adhesive strength of the removal tape while removing the active material layer and the portion of the removal tape, and when removing the The thickness of the electrode is then measured, wherein this procedure is repeated until the measurement limit is reached (step 4); and the adhesive distribution according to the thickness of the electrode is determined from the measurements obtained in steps 3 and 4 (step 5). The described method of measuring the distribution of the binder in the electrode can be used to measure the distribution of the binder more accurately by using the following method: by repeatedly attaching the removal tape to the current collector and active material layers and removing the removal tape. A procedure was performed to measure the adhesive strength according to the thickness of the electrode, wherein the procedure was repeated on the electrode spanning from the current collector to the end of the active material layer. In this case, the method can be used to perform measurements in a short time and at low cost. |
| priorityDate | 2015-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 51.