http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107526016-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2603
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2646
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2017-07-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2019-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-107526016-B
titleOfInvention A kind of detection method and device for semiconductor devices 1/f noise bound frequency
abstract The invention discloses a kind of detection method and device for semiconductor devices 1/f noise bound frequency, and device includes: shielded box, for shielding outside noise interference;Biasing circuit, for time domain waveform needed for obtaining experiment;Preamplifier, for amplifying noise signal;Digital oscilloscope, for showing the time domain waveform of input signal;PC machine, for handling inputted signal.The device of the invention has lower background noise, higher shielding outside noise interference performance, and the wirewound potential meter itself in device there's almost no 1/f noise, and the data measured are more accurate.Method of the invention can also use the wavelet transformation of other systems, such as use continuous wavelet transform, can effectively improve the accuracy of bound frequency detecting other than using Dyadic Wavelet Transform;It avoids analyzing obtained spectral characteristic curve, this conventional method of bound frequency is found in fitting using by spectrum analyzer.
priorityDate 2017-07-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID26124
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419509058

Total number of triples: 13.