| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2602
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-24585
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2443
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-24455 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20058
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y35-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-295
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-244
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82B3-0085 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B82Y35-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B82B3-00 |
| filingDate |
2016-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2019-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-107473179-B |
| titleOfInvention |
A method for characterizing two-dimensional nanomaterials |
| abstract |
The invention relates to a method for characterizing two-dimensional nanomaterials. The method comprises: setting a two-dimensional nanomaterial sample in a vacuum environment; After the two-dimensional nanomaterial sample is transmitted, a transmitted electron beam and a diffracted electron beam are formed, and imaged on an imaging device; the angle θ between the diffracted electron beam and the transmitted electron beam and the wavelength λ of the electron beam are obtained; and according to the formula dsinθ= λ calculates the lattice period d of the two-dimensional nanomaterial sample. |
| priorityDate |
2016-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |