http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106503333-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-3684 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F30-22 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-36 |
| filingDate | 2016-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2019-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-106503333-B |
| titleOfInvention | A kind of network on three-dimensional chip test-schedule method |
| abstract | The present invention discloses a kind of network on three-dimensional chip test-schedule method, a kind of Time Petri Nets model is established in conjunction with the characteristics of 3D NoC test, excitation sequence will be changed as concurrent testing mission planning scheme, rank bat algorithm is passed by improved two-stage, sequential scheduling optimization is carried out in test path distribution basis, and test resource is rationally effectively distributed to each IP kernel.The model that the present invention uses intuitively describes 3D NoC test-schedule problem, and the 3D NoC testing time can be effectively reduced, improve testing efficiency, guarantee test validity.Test-schedule algorithm of the invention has certain advantage in terms of the quality of solution, convergence rate, can effectively improve the efficiency of concurrent testing, reduces the testing time. |
| priorityDate | 2016-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415828277 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID130993 |
Total number of triples: 14.