http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106483441-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2619 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2016-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-11-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2020-11-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-106483441-B |
| titleOfInvention | Method and system for measuring internal temperature distribution of crimping type power semiconductor device |
| abstract | The invention provides a method and a system for measuring the internal temperature distribution of a crimping type power semiconductor device, wherein the method comprises the steps of constructing a finite element model of the crimping type power semiconductor device; the internal thermal stress distribution of the coupled crimping type power semiconductor device in the finite element model under the preset working condition is realized; according to the finite element model after the thermal stress is coupled, the pressure distribution inside the crimping type power semiconductor device under the preset working condition is obtained through simulation; measuring the actual pressure distribution inside the crimping type power semiconductor device under the preset working condition; and determining the actual temperature distribution of the crimping type power semiconductor device under the preset working condition. Compared with the prior art, the method and the system for measuring the internal temperature distribution of the crimping type power semiconductor device can indirectly measure the pressure distribution and the temperature distribution of the crimping type power semiconductor device under any working condition in a mode of combining test measurement and simulation measurement. |
| priorityDate | 2016-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419405613 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23932 |
Total number of triples: 12.