http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105823974-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B24B19-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2635 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B5-08 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B24B19-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B5-08 |
| filingDate | 2016-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2018-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2018-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-105823974-B |
| titleOfInvention | A method of improving LED chip testing needle trace |
| abstract | A method of improving LED chip testing needle trace, includes the following steps：（1）Grinding tool is made, which includes bistrique, monitoring window and grip shank, and grip shank is fixedly connected on bistrique, and taper hole is provided in bistrique, and abrasive material is attached on the inner wall of bistrique taper hole, and monitoring window is provided on bistrique, and monitoring window is equipped with scale；（2）Whether the needle point for observing testing needle is intact, if needle point is intact, step is used if be difficult to clean off with hairbrush or the clast removed on needle point of blowing（1）The abrasive needle point of making；（3）Needle point after grinding is tested into hand-manipulating of needle trace.This method can make testing needle grind the clast being difficult to clean off adhered on needle point under the premise of not dismantling; shorten milling time; it improves grinding efficiency and protects testing needle; and the grinding situation of needle point can be monitored in real time; to efficiently ensure that grinding quality, testing needle trace is improved, ensure that test quality; the testing needle service life is improved, production cost is reduced. |
| priorityDate | 2016-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID42503 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID451349547 |
Total number of triples: 17.