http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105823772-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-73 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-44 |
| filingDate | 2015-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2019-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-105823772-B |
| titleOfInvention | The detection method of impurity element in a kind of measurement tungsten carbide |
| abstract | The present invention provides a kind of detection method for measuring impurity element in tungsten carbide, specifically quickly measures cobalt, nickel, iron, titanium, aluminium, manganese, magnesium, vanadium, chromium, copper, molybdenum in tungsten carbide and cast tungsten carbide using inductively coupled plasma emission spectrography.Sample is cleared up in electric heating resolution instrument using hydrofluoric acid and nitric acid, in the case where not separating tungsten basal body, standard working curve is prepared with high purity tungsten Matrix Match, tungsten basal body is solved to the spectra1 interfer- of element to be measured, select each element optimal wavelength, and background correction is carried out, cobalt, nickel, iron, titanium, aluminium, manganese, magnesium, vanadium, chromium, copper, molybdenum in tungsten carbide and cast tungsten carbide are quickly measured simultaneously with inductively coupled plasma emission spectrography.Detection method of the invention is easy to operate, and detection cycle is short, and simple and convenient sample treatment, detection range is wide, is suitable for batch production analysis. |
| priorityDate | 2015-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 46.