http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105589024-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_79d8ca0893a355843ce87e9cb2e1ac4e
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2014-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1d9b933f84ffcff759800d932a39df7d
publicationDate 2016-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-105589024-A
titleOfInvention Method and apparatus for detecting reliability of IGBT power device
abstract The invention relates to the power device field, especially to a method and apparatus for detecting reliability of an IGBT power device. A microscopic infrared measurement method is used for obtaining microscopic infrared thermographys of different substrate materials and power devices and thus peak junction temperatures under different substrate temperatures and on different bias conditions are obtained; with a temperature-sensitive parameter measurement method, an average thermal resistance value of the power device is obtained; and on the basis of the peak junction temperatures, the average thermal resistance value, and the microscopic infrared thermographys, the material, the structure, and the process of the power device are evaluated effectively. Therefore, the reliability of the IGBT power device can be evaluated accurately.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108414909-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108414909-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108732481-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105865634-A
priorityDate 2014-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID10616
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419501614

Total number of triples: 16.