http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105474357-B

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-022
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-3321
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-057
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-1207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-334
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-0213
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-0475
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-028
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-0473
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3171
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-564
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-6719
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67213
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-4404
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-32477
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05H1-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3244
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-265
filingDate 2014-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2019-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-105474357-B
titleOfInvention Base plate processing system, ion implantation system and beamline ion implanters implant system
abstract The present invention provides a kind of base plate processing system, ion implantation system and beamline ion implanters implant system.The base plate processing system of system, depositing system and etch system is e.g. ion implanted, is padded with coarse SiClx.Silicon liner is roughened with the chemical process that can produce detail characteristic, seems micro- pyramid, height can be less than 20 microns.This pyramid roughening feature more common than generally in graphite backing slightly is smaller, despite the fact that in this way, roughened silicon can retain the plated film of deposition and avoid peeling off.
priorityDate 2013-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577416
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID452458000
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6093286
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559581
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID297
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID961
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24553
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID157169937
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5182128
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523397
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559568
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID447617380

Total number of triples: 44.