http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105321846-B
Outgoing Links
Predicate | Object |
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classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76825 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67 |
filingDate | 2014-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2018-02-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2018-02-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-105321846-B |
titleOfInvention | Substrate board treatment and substrate processing method using same |
abstract | The present disclosure generally relates to substrate board treatment and substrate processing method using same.The substrate processing method using same of one embodiment of the present invention includes:The step of top alternating layer provided in polysilicon repeatedly has interlayer insulating film with sacrifice layer, forms porose substrate in such interlayer insulating film and such sacrifice layer;The step of the first process gas for plasma-based state at the top of the side in the hole and bottom and the substrate to form protective layer is excited to the supply substrate;The step of the second process gas for plasma-based state being excited to the supply substrate to remove the protective layer of the side in hole formation;The step of the 3rd process gas for plasma-based state being excited to the supply substrate to remove the sacrifice layer for the side for being exposed to the hole;And excite the step of the 4th process gas for plasma-based state from the bottom at the top of the substrate and the hole to remove the protective layer to the supply substrate. |
priorityDate | 2014-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 33.