Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L33-0041 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66742 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7869 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1214 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-124 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1248 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1255 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78606 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-12 |
filingDate |
2010-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2018-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2018-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CN-105097946-B |
titleOfInvention |
Semiconductor device and its manufacture method |
abstract |
The present invention relates to semiconductor device and its manufacture method.In using the thin film transistor (TFT) of the first oxide semiconductor layer and the bottom grating structure of the lamination of the second oxide semiconductor layer; the oxide insulating layer as channel protective layer being in contact with it is formed on a part of oxide semiconductor layer overlapping with gate wiring layer; and in the identical step for forming the insulating layer, form the oxide insulating layer of the peripheral part (including side surface) of the lamination of covering oxide semiconductor layer. |
priorityDate |
2009-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |