http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105097778-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-544 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2014-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2019-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-105097778-B |
| titleOfInvention | Through-hole array for improving slope current test detectability tests structure |
| abstract | It discloses a kind of for improving the through-hole array test structure of slope current test detectability.The structure can be improved slope current test to the detectivity of defective workmanship.Through-hole array test structure includes: two or more metal line layers, and each metal line layer includes a plurality of metal wire being isolated from each other；Multiple through-hole structures between two metal line layers of the arbitrary neighborhood in described two or multiple metal line layers, wherein, in two metal line layers of the arbitrary neighborhood, a plurality of metal wire in first metal line layer is at least partly be overlapped to form multiple ecotones with a plurality of metal wire in the second metal line layer, each ecotone includes a through-hole, and the metal wire in first metal line layer only passes through the metal wire that the through-hole is electrically connected in second metal line layer. |
| priorityDate | 2014-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.