http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104934372-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K59-125
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78603
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0245
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02686
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1222
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B29-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B28-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B1-023
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1285
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78672
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02532
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0262
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02488
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-6675
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02502
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02592
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-77
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
filingDate 2015-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-104934372-B
titleOfInvention A low-temperature polysilicon thin film, its manufacturing method, and related devices
abstract The invention discloses a low-temperature polysilicon film, a manufacturing method thereof, and related devices. The main contents include: providing a base substrate, forming a heat storage function layer on the base substrate, and forming a heat storage function layer on the heat storage function layer. forming a first buffer layer, and forming a first amorphous silicon layer covering the first buffer layer, performing an excimer laser annealing process on the base substrate forming the first amorphous silicon layer to form a low-temperature polysilicon film, wherein the The heat storage functional layer and the first amorphous silicon layer can enter the heat absorption state and the heat dissipation state synchronously. Therefore, when the excimer laser annealing process is performed, the first amorphous silicon layer located on the surface can use the energy released by the bottom heat storage functional layer to delay the cooling time, thereby prolonging the growth time of low-temperature polysilicon and increasing the temperature of low-temperature polysilicon. grain size.
priorityDate 2015-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419544408
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419518429
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6327212
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID426098978
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID61330

Total number of triples: 33.