http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104597114-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J27-028 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0009 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 |
| filingDate | 2015-01-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2016-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2016-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-104597114-B |
| titleOfInvention | The mass calibration kit of high-resolution mass spectrometer negative ion mode low mass region and bearing calibration |
| abstract | The invention belongs to Mass Spectrometer Method field, relate to a kind of mass calibration kit and bearing calibration of high-resolution mass spectrometer negative ion mode low mass region.Described mass calibration kit comprises semiconductor nano material suspending liquid, free fatty acid standard solution and MALDI sample target cleaning fluid; Described bearing calibration comprises: regulate mass spectrometer sample target and slit voltage difference to be 20 volts; Get semiconductor nano material hanging drop in sample target surface, treat the complete volatile dry of solvent; Get free fatty acid standard solution and drip surface in described semiconductor nano material, treat the complete volatile dry of solvent, sample target is put into mass spectrometer and carries out mass calibration, after instrumental correction, gained correction coefficient can be used for correcting sample Mass Spectrometer Method result.Calibration reagent box of the present invention effectively can carry out the correction of MALDI mass spectrometer negative ion mode low mass region, and mass signal does not have background interference, and can carry out the Accurate Determining of micromolecular compound quality, relative error is less than 6ppm. |
| priorityDate | 2015-01-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.