http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104164704-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B29-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-4582
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-481
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B25-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B25-105
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-455
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-463
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-54
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-0209
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C30B25-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C30B25-12
filingDate 2010-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2017-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2017-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-104164704-B
titleOfInvention High throughput multi-wafer epitaxial reactor
abstract Present invention is disclosed it is a kind of can on polylith chip simultaneously deposition film epitaxial reactor.During depositing, many chips are included in chip set, and the chip set includes many chip carrying disks, and the chip carrying disk is closely separated by so as to handle volume minimization.Processing gas preferentially flows into the internal volume of chip set, and chip set is heated with one or more lamp modules.Chip set flowed outside of the purge gas in reative cell, so that the deposition on locular wall minimize.In addition, the independent lamp in lamp module illumination sequence, can further improve chip set in deposition change it is linear.In order to improve uniformity, the direction of processing gas flowing can be with cross flow one change of configuration.Lamp bank sequence is combined in multiple reactor assemblies and cross flow one is handled, can there is the deposition and good uniformity of film of high yield, and processing gas is efficiently used.
priorityDate 2009-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID61622
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419593638
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557764
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6399
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419524320
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24811
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457277700
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID31170
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

Total number of triples: 35.