http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104134697-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42356
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7839
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66477
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66969
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-1079
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7828
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-47
filingDate 2014-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2017-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2017-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-104134697-B
titleOfInvention Asymmetric Schottky source drain transistor and preparing method thereof
abstract The invention discloses a ring gate MOS transistor combining a vertical channel and an asymmetric Schottky barrier source/drain structure. The ring gate MOS transistor comprises the ring semiconductor channel (4) in the vertical direction, a ring gate electrode (6), a ring gate dielectric layer (5), a source region (2), a drain region (3) and a semiconductor substrate (1), wherein the source region is located at the bottom of the vertical channel (4) and connected with a substrate, the drain region is located on the top of the vertical channel, the gate dielectric layer and the gate electrode annularly surround the vertical channel, Schottky contacts with different barrier heights can be formed by the source region and the channel and the drain region and the channel respectively, and the source region and the drain region are made of different metal materials. The ring gate MOS transistor is compatible with an existing CMOS technology, various advantages of the traditional GAA are reserved, the leakage current is reduced through the asymmetric Schottky barrier source/drain structure, the technology requirement is lowered, the limitation of processing photoetching extremity is broken through via the vertical channel and the ring gate structure, and the integrity is improved.
priorityDate 2014-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6326954
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID452580220
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453275488
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577474
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24261
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID783
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425193155
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID292779
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID18618944
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520488
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523132
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457707758
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID161266530
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23986

Total number of triples: 36.