http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104115253-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-623
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0004
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-26
filingDate 2011-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2016-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-104115253-B
titleOfInvention Use the quality analysis apparatus of scanner light source
abstract The present invention relates to a kind of mass analysis method using scanner light source and device, more particularly, to the measuring instrument of a kind of quality for analyzing the sample ionized by scanner light source.Quality analysis apparatus according to the present invention includes: laser part, and it launches laser beam;Scanner module, it performs to drive so that the laser beam launched from described laser part irradiates presumptive area;Sample holder, it receives from the laser of scanner module and keeps sample;Second high voltage power supply, it provides voltage to sample holder;First ion-optic system, it is arranged on the position away from sample holder preset distance, and forms the sample of the ionization that voltage is kept by sample holder with acceleration;And first high voltage power supply, it provides voltage to the first ion-optic system.
priorityDate 2011-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962

Total number of triples: 16.