http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103700619-B

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2221-1068
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76879
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-426
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C25D5-00
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C25D5-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 2013-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2016-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-103700619-B
titleOfInvention Copper-connection is electroplated fill method
abstract The present invention relates to a kind of copper-connection and electroplate fill method, comprise the following steps: using the copper plating bath of filling for hole as electrolyte, put into three-electrode system, measure its electrochemistry curve; Determine current peak and magnitude of voltage corresponding to electric current paddy difference according to electrochemistry curve; The sample with pore structure is put into three-electrode system as working electrode, make the voltage of hole surface corresponding to voltage corresponding to electric current paddy on electrochemistry curve, after energising, take out; The thickness of copper is filled in measured hole cross section everywhere, and its thickness is corresponding to the position of current peak on electrochemistry curve; Adjust the concentration of copper plating bath, change the position of current peak and electric current paddy on its electrochemistry curve, make the voltage of hole surface in electro-coppering process corresponding to voltage corresponding to electric current paddy on electrochemistry curve, the voltage at the bottom of hole is corresponding to voltage corresponding to current peak on electrochemistry curve. The present invention can realize flawless perfect filling of copper facing, and easy and simple to handle, can be widely used in various high-end electronic manufacturing fields.
priorityDate 2013-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449391796
http://rdf.ncbi.nlm.nih.gov/pubchem/anatomy/ANATOMYID282391
http://rdf.ncbi.nlm.nih.gov/pubchem/taxonomy/TAXID282391
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559356
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID30856
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24956
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419522247
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458431511
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID454103209
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525958
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID87206
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5460490
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525490
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID87138462
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID27099
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID450960374
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID411832067
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID10298
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID76123
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23939

Total number of triples: 39.