http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103616627-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2013-11-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2016-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2016-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-103616627-B |
| titleOfInvention | A kind of semiconductor laser chip testing arrangement |
| abstract | Patent of the present invention is a kind of semiconductor laser chip testing arrangement, comprise two vertical guide rails, circuit board and oxide isolated copper part are installed on described vertical guide rail, described oxide isolated copper part is arranged on sliding block, described vertical guide rail is arranged on the copper base of below, on described copper base, be fixed with stainless steel column, semiconductor laser chip and piston, described stainless steel upright post sleeve has spring, on described circuit board, be welded with spring probe, described spring probe below is provided with described semiconductor laser chip, above described semiconductor laser chip, be provided with one and a half spherical envelope, on the optical track mark of described semiconductor laser chip transmitting, be provided with integrating sphere array, integrating sphere on described integrating sphere array is arranged on described copper base. adopt technical solution of the present invention, this device can be installed many semiconductor laser chips automatically reliably, has improved testing efficiency and testing reliability. |
| priorityDate | 2013-11-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 14.