http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103109175-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc3e639586089fe232d0cfb27383c875 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0426 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0423 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02827 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0256 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0427 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0094 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-022 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-036 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N11-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N5-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F17-13 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N11-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N5-02 |
| filingDate | 2011-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2015-07-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8a0f0bca6d87006bbafbe90bd9b0f6ce http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_09b0bdc8574cfdcd1dd050d886b8af37 |
| publicationDate | 2015-07-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-103109175-B |
| titleOfInvention | Method of measuring viscoelasticity coefficients of material and device for measuring viscoelasticity coefficients of material |
| abstract | To provide a method of measuring the viscoelasticity coefficients of a material and a device for the viscoelasticity coefficients of a material with which it is possible to represent information of the viscoelasticity of an adsorbent material with coefficients G and G which are typically used in representing viscoelasticity, and with which it is further possible to compute the viscoelasticity coefficients in real time. In a system wherein a material is adsorbed and a film formed, either upon the surface of a piezoelectric element in solution, or on a film which is fixed upon the piezoelectric element in solution, using at least two of N overtones of the piezoelectric element, and for each N overtone, employing at least two of the resonant frequency FS and half-value frequencies F1, F2 (where F2 > F1) having half the conductance value of the conductance value of the resonant frequency, the mass load term, the viscoelasticity term, the viscoelasticity term, and the viscoelasticity term are computed, and the viscoelasticity coefficients G (stored modulus portion) and G (loss modulus portion) of the film are computed. |
| priorityDate | 2010-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.