http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103064222-B

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-136
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-4908
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-1368
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-12
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1368
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1362
filingDate 2008-07-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2016-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-103064222-B
titleOfInvention Liquid crystal indicator
abstract It is an object of the invention to provide the liquid crystal indicator with the thin film transistor (TFT) that electrical characteristics are high and reliability is high.In the liquid crystal indicator of reciprocal cross shift thin film transistor (TFT) with channel cutoff type, the reciprocal cross shift thin film transistor (TFT) of this channel cutoff type includes: gate electrode;Gate insulating film on gate electrode;The microcrystalline semiconductor film including channel formation region on gate insulating film;Cushion on microcrystalline semiconductor film;Channel protective layer on the buffer layer is formed overlappingly with the channel formation region of microcrystalline semiconductor film.
priorityDate 2007-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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Total number of triples: 26.