http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102886284-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d9de52bba13e16028dffa8775e3f3f28 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B01L7-00 |
| filingDate | 2012-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2015-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_04a830095f8c065c791033543ce3b95a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_88d5dd9491e6b1d9143ebe3ed69a8b87 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2d60d1ed09c7391d7e2ea70c8a1fc089 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21b2402be3b4090b57789bcea39bf756 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c67b9fe18edf4beaf07370b51f3d2d27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0222838426497882238fa9681b2a27bb |
| publicationDate | 2015-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-102886284-B |
| titleOfInvention | High-low-temperature normal-pressure heat cycle test device |
| abstract | The invention discloses a high-low-temperature normal-pressure heat cycle test device which can operate by adopting a high-low-temperature environment simulating device combining a gas-liquid heat exchanger and a pipeline electric heater. The device can realize a heat cycle test environment in a temperature range from -100 DEG C to +100 DEG C under normal pressure. The high-low-temperature normal-pressure heat cycle test device comprises an environment simulating cabin body, a high-low-temperature gas generating system, a gas displacing system and a cold source system, and can finish a plurality of types of test processes needed by carrying out a heat cycle test. The environment simulating cabin body is used for placing a tested piece to be subjected to the heat cycle test; the high-low-temperature gas generating system is used for conveying gas and adjusting parameters including the speed, the temperature and the like for conveying air; the gas displacing system is used for discharging water steam and impurities in a system through a gas displacing effect in a displacing process so as to prevent the tested piece from being damaged; and the cold source system is used for providing a cold source in a temperature reducing process and providing nitrogen gas in the displacing process. The device has a simple structure and a reasonable design, and can effectively meet the requirements of the high-low-temperature heat cycle test. |
| priorityDate | 2012-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.