http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102735597-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_215fd62f148bc5aab2bfc8e46ecd6126 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-02 |
| filingDate | 2012-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_04dc3ca3a79172aeb66210f67ef8a183 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0aa92671cc5edb3e83444cf99840e46b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5d10d08f954633a7a9a687242739156 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e292c344210e2fbb87501a6e95282eb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f8e8c15bd67b8b357cca39cebf8c8560 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fe85a81b6ac9e25f543c3440e1fbb96a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aa4e328ea6fd790b5f9cca443741b565 |
| publicationDate | 2013-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-102735597-B |
| titleOfInvention | Method for evaluating rubber mixing process |
| abstract | The invention belongs to the technical field of evaluation of rubber production and relates to a method for evaluating a rubber mixing process. The method comprises the following steps of: cutting rubber to be mixed into 25 sample wafers for use by conventional equipment, adopting a microscopy process, obtaining carbon black information by analyzing a rubber material image including carbon black; observing the sections of the rubber material sample wafers by a microscope; inputting the amplified section image into a computer by a digital imaging device; then converting a grey image into a black-and-white image by binaryzation by a threshold segmentation method, and achieving identification of a carbon black aggregate; then respectively selecting five different areas of each sample wafer to detect respectively; calculating mean radius of the carbon black aggregate in each area and the concentration in sizing material; and obtaining data of the sample wafers according to five detection results of each sample wafer, and then carrying out stability judgment. The method has the advantages that the principle is reliable, the process is simple and easily controlled, evaluation is accurate; the index is clear, and the application prospect is wide. |
| priorityDate | 2012-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID297 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559581 |
Total number of triples: 20.