http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102288903-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c094c8526b300120081f9f27c0ba8f7c |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-12 |
| filingDate | 2011-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2014-12-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45108cd3911df6b384c24a7774367181 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b0a8f0f49591ecc4f5bfb8d315e812a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3c520096d703694c618a05d20a9baf34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89f83e7eaf89d937a0aeb4796c5030bb |
| publicationDate | 2014-12-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-102288903-B |
| titleOfInvention | Test structure and method for interconnect resources in field programmable gate array (FPGA) |
| abstract | The invention relates to a test structure for interconnect resources in a field programmable gate array (FPGA). The test structure is a built-in self test structure; a test pattern generator (TPG), an output response analyser (ORA) and a circuit under test (CUT) are composed of internal resources of the FPGA; and the whole test structure is realized by writing a test configuration program for configuring the FPGA. A test method for the interconnect resources in the FPGA comprises the following six steps of: 1, arranging configuration logic blocks (CLBs); 2, configuring the TPG; 3, configuring the ORA; 4, configuring the CUT; 5, establishing a readback file by using an FPGA development platform, running the FPGA, reading analysis result data saved in a trigger in the ORA, and detecting and positioning a fault; and 6, repeating the steps 1-5, and completing four-time configuration of dual-long-line resources with CLB rank, intelligent long-line resources, dual-long-line resources without CLB rank and intelligent long-line resources and a final test according to the distribution of the CLBs and the type of the CUT. |
| priorityDate | 2011-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.