| abstract |
The present invention generally relates to low temperature plasma probes for desorbing and ionizing at least one analyte in a sample material and methods of use thereof. In one embodiment, the present invention generally relates to a low temperature plasma probe comprising: a housing with a discharge gas inlet, a probe tip, two electrodes, and a dielectric barrier, wherein the two electrodes are covered by the The dielectric barrier separates, and wherein a voltage applied by a power source forms a low temperature plasma, and wherein the low temperature plasma is driven out of the discharge region by an electric field and/or a discharge gas flow. |