| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-1497
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6421
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6419
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-1006
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-058 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1484
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1436
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1425
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6428
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-645
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1459 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-483
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-00 |
| filingDate |
2008-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2013-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b3372203ba73f2d0be8df0ddc91398da
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e2a26665fb5ddb7bbfbf486c4601fd2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_28bd9068338839eed0b54b8fe1b4345e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f5d993c6d6bcaef404809ae30209982f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1604783b62a1df5fdc1b1506d4596ccd |
| publicationDate |
2013-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-101424612-B |
| titleOfInvention |
Fine particle measuring method, substrate for measurement, and measuring apparatus |
| abstract |
A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed, further, a substract and apparatus for the measurement are disclosed too. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels (111); detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels (111). |
| priorityDate |
2007-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |