Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_99505f5f312672820e9f78c254c00a4d |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01D11-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G12B5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B15-04 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G12B5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q90-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B15-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01D11-30 |
filingDate |
1981-12-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b4bd5afc44b78c04fca6a96eecf555c3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1d63efd99697b628d6a7c56f6d9a2051 |
publicationDate |
1985-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CH-649408-A5 |
titleOfInvention |
MEASURING APPARATUS, IN PARTICULAR THICKNESS THICKNESSES, WITH COORDINATION OF THE AXIS OF A MEASURING PROBE WITH A NORMAL ON THE SURFACE OF A PART TO BE TESTED. |
priorityDate |
1980-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |