| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f08ac6fa1b553bef3ad156980c533140 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-25875
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-214 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0459
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0431
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0031 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04 |
| filingDate |
2011-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2018-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_73075271d6f2035db2a42266a7cc7025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b6ed1421e14592206e33dec3031a896
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_282c8c865a363816fc6f34c772c65a4f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d8e34f39ab4197f01a6e5d895b4d1dfb |
| publicationDate |
2018-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CA-2823711-C |
| titleOfInvention |
Systems and methods for sample analysis |
| abstract |
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer. |
| priorityDate |
2011-01-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |